Neutralization phenomena observed with secondary ions originating from inner-shell excitationWITTMAACK, Klaus.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 141-145, issn 0142-2421, 5 p.Conference Paper

Chemical composition and microstructure of waxy plant surfaces: triterpenoids and fatty acid derivatives on leaves of Kalanchoe daigremontianaJETTER, Reinhard; SODHI, Rana.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 326-330, issn 0142-2421, 5 p.Conference Paper

Depth Profiling of Anodic Tantalum Oxide Films with Gold Cluster IonsPOERSCHKE, David; WUCHER, Andreas.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 171-174, issn 0142-2421, 4 p.Conference Paper

D-SIMS analysis supporting SiO_xN_y film in-line metrologyBUDRI, Thanas; GETCHELL, Donald.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 559-561, issn 0142-2421, 3 p.Conference Paper

Sputtered molecular fluoride anions: HfF_n^- and WF_n^-GNASER, Hubert; GOLSER, Robin.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 32-35, issn 0142-2421, 4 p.Conference Paper

ToF-SIMS depth profiling of vitamin C layers using Cs⁺ and Xe⁺ ion beamsWEHBE, Nimer; HOUSSIAU, Laurent.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 190-193, issn 0142-2421, 4 p.Conference Paper

Chemical depth profiling of copper oxide film by ToF-SIMS using Bi₃⁺⁺ clusterMASUDOME, Harumi; ABE, Hiroko.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 664-668, issn 0142-2421, 5 p.Conference Paper

Cold plasma cleaning of copper and aluminum tested by SIMS depth profile analysisKONARSKI, P; OPALINSKA, T.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 612-617, issn 0142-2421, 6 p.Conference Paper

Molecular depth profiling with reactive ions, or why chemistry matters in sputteringHOUSSIAU, L; MINE, N.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 146-150, issn 0142-2421, 5 p.Conference Paper

Molecular ions in cluster bombardment: What clues do the molecular dynamics simulations provide?GARRISON, Barbara J.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 134-136, issn 0142-2421, 3 p.Conference Paper

Negative ion yield and sputter yield variations for Cs⁺ bombardment of Si with O₂ gas floodingFRANZREB, Klaus; WILLIAMS, Peter.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 129-133, issn 0142-2421, 5 p.Conference Paper

Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMSSEAH, M. P; GILMORE, I. S.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 228-235, issn 0142-2421, 8 p.Conference Paper

Depth profiling of micrometer-order area by mesa-structure fabricationSEKI, S; TAMURA, H; WADA, Y et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 154-158, issn 0142-2421, 5 p.Conference Paper

Developing ToF-SIMS methods for investigating the degradation of plastic debris on beachesBIESINGER, Mark C; CORCORAN, Patricia L; WALZAK, Mary Jane et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 443-445, issn 0142-2421, 3 p.Conference Paper

From FIB-SIMS to SIMS-FIB. The prospects for a 10 nm lateral resolution SIMS instrument with full FIB functionalityMCPHAIL, David S; LIBING LI; CHATER, Richard J et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 479-483, issn 0142-2421, 5 p.Conference Paper

Investigation of fullerene depth distribution in PMMA-C₆₀ blends using dual beam ToF-SIMSPY, M; BARNES, J. P; CHARBONNEAU, M et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 179-182, issn 0142-2421, 4 p.Conference Paper

Ion, sputter and useful ion yields for accurate quantification of Si_1-xGe_x(O < x < 1) using ultra low energy O₂⁺ SIMSMORRIS, R. J. H; DOWSETT, M. G.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 543-546, issn 0142-2421, 4 p.Conference Paper

MeV-energy probe SIMS imaging of major components in washed and fractured animal cellsYAMADA, H; NAKATA, Y; NINOMIYA, S et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 363-366, issn 0142-2421, 4 p.Conference Paper

Real-time localization of single C₆₀ impacts with correlated secondary ion detectionELLER, M. J; VERKHOTUROV, S. V; DELLA-NEGRA, S et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 484-487, issn 0142-2421, 4 p.Conference Paper

The Storing Matter technique: Application to PVC using Au and Ag collectorsBECKER, N; WIRTZ, T; MIGEON, H.-N et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 502-505, issn 0142-2421, 4 p.Conference Paper

The cuticular surface of D. melanogaster: ToF-SIMS on the flyLEVINE, J; BILLETER, J.-C; KRULL, U et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 317-321, issn 0142-2421, 5 p.Conference Paper

The use of low-energy SIMS (LE-SIMS) for nanoscale fuel cell material developmentMORRIS, R. J. H; FEARN, S; PERKINS, J et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 635-638, issn 0142-2421, 4 p.Conference Paper

Three-dimensional reconstruction of a nickel-alumina composite coating by FIB-SIMSCHATER, Richard J; CORNI, Ilaria; BOCCACCINI, Aldo R et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 492-494, issn 0142-2421, 3 p.Conference Paper

ToF-SIMS imaging of surface self-organized fractal patterns of bacteriaTUCCITTO, N; MARLETTA, G; CARNAZZA, S et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 370-375, issn 0142-2421, 6 p.Conference Paper

Ultra-low-angle microtomy to back up S-SIMS molecular depth profiling with C₆₀⁺ and Bi_n⁺ for the nanoscale analysis of high-tech industrial materialsDE MONDT, R; VERCAMMEN, Y; DARDENNE, R et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 389-392, issn 0142-2421, 4 p.Conference Paper